Devices for linear measurements from 0.2 nm to 200 mm.
Model 130 profiler: 0–40 mm, Ra up to 0.004 μm.
Model 220 contrograph: 0–220 mm, accuracy 0.1 μm.
SMM-2000 microscope: accuracy up to 0.2 nm.
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Measuring instruments | Russia, Зеленоград, Солнечная аллея, д. 8 |
Devices for linear measurements from 0.2 nm to 200 mm.
Model 130 profiler: 0–40 mm, Ra up to 0.004 μm.
Model 220 contrograph: 0–220 mm, accuracy 0.1 μm.
SMM-2000 microscope: accuracy up to 0.2 nm.
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