Devices for linear measurements from 0.2 nm to 200 mm:
- Model 130 profilometer: 0–40 mm, Ra up to 0.004 μm;
- contourograph model 220: 0-220 mm, accuracy 0.1 microns;
- SMM-2000 microscope: accuracy up to 0.2 n ...
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Laboratory equipments | Russia, пл. Шокина, д. 1, стр. 6 |
Devices for linear measurements from 0.2 nm to 200 mm:
- Model 130 profilometer: 0–40 mm, Ra up to 0.004 μm;
- contourograph model 220: 0-220 mm, accuracy 0.1 microns;
- SMM-2000 microscope: accuracy up to 0.2 n ...
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